Single-Event Effects Test Report Analog Devices MAX881R Low-Noise Bias Supply

The purpose of this test is to characterize the single-event effects (SEE) and susceptibility of Analog Devices’ MAX881R low-noise inverting power supply. These parts were irradiated with the 16 MeV/amu heavy ion cocktail at the Berkeley Accelerator Space Effects (BASE) Facility at the Lawrence Berkeley National Laboratory (LBNL). The test date was August 28-29, 2024.