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Reliability Impacts of Non-Destructive Single-Event Latch-Ups in Commercial ElectronicsThis paper presents the results of reliability life testing performed on commercial electronic devices that experienced non-destructive single-event latch-up (SEL) during heavy-ion testing.
Document ID
20250006971
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Stephen Martinez (Amentum Chantilly, Virginia, United States)
Razvan Gaza (Johnson Space Center Houston, United States)
Ray Ladbury (Goddard Space Flight Center Greenbelt, United States)
Lyudmyla Ochs (Goddard Space Flight Center Greenbelt, United States)
Greg Allen ORCID(Jet Propulsion Laboratory La Cañada Flintridge, United States)
Alyson Topper (Goddard Space Flight Center Greenbelt, United States)
Timothy Mondy (Goddard Space Flight Center Greenbelt, United States)
Robert Hodson (Langley Research Center Hampton, United States)
Date Acquired
July 11, 2025
Publication Date
July 14, 2025
Publication Information
Publisher: Institute of Electrical and Electronics Engineers
Subject Category
Electronics and Electrical Engineering
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC)
Location: Nashville, TN
Country: US
Start Date: July 14, 2025
End Date: July 18, 2025
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: 80JSC022DA035
TASK: TI-23-09145
WBS: 869021.05.72.14.15
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
NASA Peer Committee
Keywords
Radiation
Single-Event Effects
Single-Event Latch-Up
Reliability
COTS
Latent Damage
CMOS
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