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Fitting a model to floating gate prompt charge loss test data for the Samsung 8 Gb SLC NAND flash memory
External Source
jpl
Document Type
Preprint
Authors
Edmonds, L. D.
Irom, F.
Allen, G.R.
Date Acquired
February 10, 2024
Publication Date
September 19, 2016
Publication Information
Publisher: Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2016
DOI: http://hdl.handle.net/2014/46238
Distribution Limits
Public

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