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Measurement of wavelength-dependent radiation pressure from photon reflection and absorption due to thin film interference
External Source
chorus
Document Type
Version of Record
Authors
Dakang Ma
Jeremy N. Munday
Date Acquired
December 15, 2025
Publication Information
Publication: Scientific Reports
Publisher: Springer Science and Business Media LLC
Volume: 8
Issue: 1
Issue Publication Date: December 1, 2018
e-ISSN: 2045-2322
DOI: 10.1038/s41598-018-34381-z
Funding Number(s)
funding: NNX12AQ50G
Distribution Limits
Public

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