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Increasing Redundancy Exponentially Reduces Error Rates during Algorithmic Self-Assembly
External Source
chorus
Document Type
Version of Record
Authors
Rebecca Schulman (Computation and Neural Systems, California Institute of Technology, Pasadena, California 91125, United States)
Christina Wright (Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States)
Erik Winfree (Computer Science, Computation and Neural Systems, and Bioengineering, California Institute of Technology, Pasadena, California 91125, United States)
Date Acquired
October 28, 2024
Publication Date
December 5, 2015
Publication Information
Publication: ACS Nano
Publisher: American Chemical Society (ACS)
Volume: 9
Issue: 6
ISSN: 1936-0851
e-ISSN: 1936-086X
DOI: 10.1021/nn507493s
Funding Number(s)
funding: CCF-0432193
funding: NNG06GA50G
Distribution Limits
Public

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