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Investigation of the deflection of an electron beam as a means of measuring electric field strengthDeflection of electron beam as means for measuring electric field strength
Document ID
19660018733
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Shriver, E. L. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 2, 2013
Publication Date
April 12, 1966
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-TM-X-53435
Report Number: NASA-TM-X-53435
Accession Number
66N28023
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
ELECTRON BEAM
ELECTRIC FIELD STRENGTH
DEFLECTION

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