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Investigation of a proposed technique for measurements of dielectric constants and losses at V-band using the Fabry-Perot principleFabry-Perot interferometer to measure dielectric constants and loss tangents at V-band
Document ID
19660023009
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Balanis, C. A. (M.S. THESIS - VIRGINIA UNIV.)
Date Acquired
September 2, 2013
Publication Date
August 1, 1966
Subject Category
Physics, Solid-State
Report/Patent Number
NASA-TM-X-57770
Report Number: NASA-TM-X-57770
Accession Number
66N32299
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
DIELECTRIC CONSTANT
FABRY-PEROT INTERFEROMETER
ELECTRIC FIELD STRENGTH
V-BAND

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