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Mechanisms of ionizing radiation surface effects on transistors.Ionizing radiation effects on silicon planar bipolar transistors to determine degradation mechanisms
Document ID
19660058029
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Nelson, D. L.
Sweet, R. J.
Date Acquired
August 3, 2013
Publication Date
July 1, 1966
Subject Category
Electronic Equipment
Accession Number
66A37319
Funding Number(s)
CONTRACT_GRANT: NAS8-20135
Distribution Limits
Public
Copyright
Other
Keywords
IONIZING RADIATION
METAL OXIDE SEMICONDUCTOR /MOS/
SILICON TRANSISTOR
RADIATION EFFECT

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