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Application of a truncated normal failure distribution in reliability testingStatistical truncated normal distribution function is applied as a time-to-failure distribution function in equipment reliability estimations. Age-dependent characteristics of the truncated function provide a basis for formulating a system of high-reliability testing that effectively merges statistical, engineering, and cost considerations.
Document ID
19680000179
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Groves, C., Jr.
Date Acquired
August 4, 2013
Publication Date
June 1, 1968
Subject Category
Physical Sciences
Report/Patent Number
MFS-14328
Report Number: MFS-14328
Accession Number
68B10179
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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