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Temperature controlled strain gaged extensometerTemperature controlled strain-gaged extensometer measures longitudinal and girth deflections of pressure vessels in excess of one percent strain during pressurization and depressurization with cryogenic fluids at cryogenic temperatures. The device is of beryllium-copper strips.
Document ID
19680000499
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Ramos, G. L.
Seplow, S.
Date Acquired
August 4, 2013
Publication Date
December 1, 1968
Subject Category
Electronic Components And Circuits
Report/Patent Number
LEW-10353
Report Number: LEW-10353
Accession Number
68B10543
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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