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Microwave flaw detector PatentSurface defect detection by reflected microwave radiation pattern
Document ID
19710008347
Acquisition Source
Legacy CDMS
Document Type
Other - Other
Authors
Feinstein, L. (NASA Ames Research Center Moffett Field, CA, United States)
Hruby, R. J. (NASA Ames Research Center Moffett Field, CA, United States)
Date Acquired
August 6, 2013
Publication Date
October 6, 1970
Subject Category
Machine Elements And Processes
Report/Patent Number
Patent Number: NASA-CASE-ARC-10009-1
Patent Application Number: US-PATENT-APPL-SN-714595
Patent Number: US-PATENT-3,532,973
Accession Number
71N17822
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-ARC-10009-1|US-PATENT-3,532,973
Patent Application
US-PATENT-APPL-SN-714595

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