Refractive index and birefringence of 2H silicon carbide

The refractive indices of 2H SiC were measured over the wavelength range 435.8 to 650.9 nm by the method of minimum deviation. At the wavelength lambda = 546.1 nm, the ordinary index n sub 0 was 2.6480 and the extraordinary index n sub e was 2.7237. The estimated error (standard deviation) in the measured values is 0.0006 for n sub 0 and 0.0009 for n sub e. The experimental data were curve fitted to the Cauchy equation for the index of refraction as a function of wavelength. The birefringence of 2H SiC was found to vary from 0.0719 at lambda = 650.9 nm to 0.0846 at lambda = 435.8 nm.