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Thermal noise in space-charge-limited hole current in siliconPresent theories on noise in single-carrier space-charge-limited currents in solids have not been quantitatively substantiated by experimental evidence. To obtain such experimental verification, the noise in specially fabricated silicon structures is being measured and analyzed. The first results of this verification effort are reported.
Document ID
19720024322
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Shumka, A. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Golder, J. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Nicolet, M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 6, 2013
Publication Date
July 1, 1972
Publication Information
Publication: JPL Quart. Tech. Rev., Vol. 2, No. 2
Subject Category
Physics, Solid-State
Accession Number
72N31972
Distribution Limits
Public
Copyright
Public Use Permitted.
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IDRelationTitle19720024314Collected WorksJPL Quarterly Technical Review, Volume 2, No. 2, July 1972N72-31964 22-34Collected Works
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