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Field-ion microscopy of ordered Cu-Au alloy.A method is proposed for overcoming current difficulties in measuring atomic order parameters of nonrefractory metals when using the field-ion microscope (FIM). Near stoichiometric CuAu and Cu3Au were tested by means of this method. Images of substantially fully ordered CuAu and Cu3Au thus obtained are presented and discussed.
Document ID
19720030882
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Son, U. T.
Hren, J. J. (Florida, University Gainesville, Fla., United States)
Date Acquired
August 6, 2013
Publication Date
December 1, 1971
Publication Information
Publication: Journal of Applied Physics
Volume: 42
Subject Category
Physics, Solid-State
Accession Number
72A14548
Distribution Limits
Public
Copyright
Other

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