Determination of Van der Waals broadening at temperatures of astrophysical interest.

Discussion of the results of experiments analyzing the widths of shock-excited emission lines at temperatures of about 5000 K. The width of two neutral silicon lines (4102 and 5948 A) were measured as broadened by argon, and the shift of one of these lines (4102 A) was determined. Likewise, the width one of the lines of cesium (4593 A) was measured as broadened by argon and neon. These data are compared with other experimental data to determine the temperature dependence of the broadening. Significant disagreements with simple theory are found, the experimental values of the widths being larger than the theoretical values by factors of 1.5-2.