Refractive index and birefringence of 2H silicon carbide.

Measurement of the refractive indices of 2H SiC over the wavelength range from 435.8 to 650.9 nm by the method of minimum deviation. A curve fit of the experimental data to the Cauchy dispersion equation yielded, for the ordinary index, n sub zero = 2.5513 + 25,850/lambda squared + 8.928 x 10 to the 8th power/lambda to the 4th power and, for the extraordinary index, n sub e = 2.6161 + 28,230/lambda squared + 11.490 x 10 to the 8th power/lambda to the 4th power when lambda is expressed in nm. The estimated error (standard deviation) in these values is plus or minus 0.0006 for n sub zero and plus or minus 0.0009 for n sub e. The birefringence calculated from these expressions is about 20% less than previously published values.