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Broadening of fast-beam spectral lines due to diffraction at the entrance slit of a spectrometer.Experimental and theoretical demonstration of the necessity to take into account the effects of diffraction at a spectrometer's entrance slit in adjusting the spectrometer for observation of fast-beam spectral lines under conditions of minimum linewidth. An approximate expression is obtained for the optimum entrance slit width to be used in order to avoid the pronounced broadening of the spectral lines that occurs for very narrow entrance slits.
Document ID
19720047717
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Leavitt, J. A.
Stoner, J. O., Jr.
(Arizona, University Tucson, Ariz., United States)
Date Acquired
August 6, 2013
Publication Date
May 15, 1972
Publication Information
Publication: Applied Physics Letters
Volume: 20
Subject Category
Physics, Atomic, Molecular, And Nuclear
Accession Number
72A31383
Funding Number(s)
CONTRACT_GRANT: F33615-70-C-1007
Distribution Limits
Public
Copyright
Other

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