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High energy-resolution studies of electron impact optical excitation functions. I - The second positive system of N2.The relative emission cross section for the N2 second positive system (0,0) and (1,0) bands excited by electron impact was measured for incident electron energies from threshold to 17 eV. The use of a high energy-resolution electron spectrometer coupled to an optical detection system made it possible to obtain the measurements with an incident electron beam having an energy half width of 50 meV. Calibration of the incident electron energy was provided by observing the scattering resonances in nitrogen and helium. The maximum of the (0,0) and (1,0) bands were found to be at approximately 14.02 and 14.3 eV, respectively. A small structural feature that was pressure-independent appeared only in the (0,0) band emission cross section. Another such feature was pressure-dependent and appeared more strongly in the (1,0) band cross section.
Document ID
19720049256
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Finn, T. G.
Doering, J. P.
(Johns Hopkins University Baltimore, Md., United States)
Aarts, J. F. M.
Date Acquired
August 6, 2013
Publication Date
June 1, 1972
Publication Information
Publication: Journal of Chemical Physics
Volume: 56
Subject Category
Physics, Atomic, Molecular, And Nuclear
Accession Number
72A32922
Funding Number(s)
CONTRACT_GRANT: NGR-21-001-001
Distribution Limits
Public
Copyright
Other

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