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A graphite crystal polarimeter for stellar X-ray astronomy.The first crystal X-ray polarimeter to be used for X-ray astronomy is described. Polarization is measured by modulation of the X rays diffracted at an average 45 deg glancing angle from large, curved graphite crystal panels as these rotate about an axis parallel to the incident X-ray flux. Arrangement of the crystal panels, the design of the detector, and the signal-processing circuitry were optimized to minimize systematic effects produced by off-axis pointing of the rocket and cosmic ray induced events. The in-flight performance of the instrument in relation to the observed background signal is discussed.
Document ID
19720050971
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Weisskopf, M. C.
Berthelsdorf, R.
Epstein, G.
Linke, R.
Mitchell, D.
Novick, R.
Wolff, R. S.
(Columbia University New York, N.Y., United States)
Date Acquired
August 6, 2013
Publication Date
July 1, 1972
Publication Information
Publication: Review of Scientific Instruments
Volume: 43
Subject Category
Instrumentation And Photography
Accession Number
72A34637
Funding Number(s)
CONTRACT_GRANT: NGR-33-008-102
CONTRACT_GRANT: NAS5-11362
CONTRACT_GRANT: NGL-33-008-012
Distribution Limits
Public
Copyright
Other

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