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Survey of current component reliability problems and methods for prevention.The current reliability problems related to electronic components and microcircuits are presented in this paper. Specific process controls, design, materials, application constraints, destructive testing, electrical tests, and procedures for implementation are recommended to improve the reliability of selected electronic components.
Document ID
19720053436
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Hamiter, L.
Villella, F. (NASA Marshall Space Flight Center Parts and Microelectronics Technology Office, Huntsville, Ala., United States)
Date Acquired
August 6, 2013
Publication Date
January 1, 1972
Subject Category
Electronic Equipment
Meeting Information
Meeting: High reliability electronic components; International Conference
Location: Toulouse
Country: France
Start Date: March 6, 1972
End Date: March 10, 1972
Accession Number
72A37102
Distribution Limits
Public
Copyright
Other

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