NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Investigation of Some Characteristics Related to PCM Thermal CapacitorsIn order to provide greater flexibility, shorter computer time, and a parametric study, attention was devoted to an implicit numerical scheme. The experimental work involved outlining and monitoring approximately fourteen tests of an invertable capacitor. Surface and PCM temperatures were measured at several locations and photographs were made of the PCM during melting and solidification. Some typical experimental results are presented and discussed.
Document ID
19730006218
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Griggs, E. I.
(Tennessee Technological Univ. Cookeville, TN, United States)
Date Acquired
August 7, 2013
Publication Date
September 1, 1972
Publication Information
Publication: Auburn Univ. The NASA-ASEE Summer Fac. Fellowship Program
Subject Category
Electronic Equipment
Accession Number
73N14945
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Document Inquiry

Available Downloads

There are no available downloads for this record.
No Preview Available