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A quick accurate method to measure the dielectric constant of microwave integrated-circuit substrates.
Document ID
19730040064
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Howell, J. Q. (NASA Langley Research Center Hampton, Va., United States)
Date Acquired
August 7, 2013
Publication Date
March 1, 1973
Publication Information
Publication: IEEE Transactions on Microwave Theory and Techniques
Volume: MTT-21
Subject Category
Electronic Equipment
Accession Number
73A24866
Distribution Limits
Public
Copyright
Other

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