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Noise of space-charge-limited current in solids is thermal.The white noise level of space-charge-limited current (SCLC) of holes in a silicon device measured at five temperatures ranging from 113 to 300 K is shown to be proportional to the absolute temperature. This proves experimentally the thermal origin of noise for SCLC in solids.
Document ID
19730056757
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Golder, J.
Nicolet, M.-A. (California Institute of Technology Pasadena, Calif., United States)
Shumka, A. (California Institute of Technology, Jet Propulsion Laboratory, Pasadena Calif., United States)
Date Acquired
August 7, 2013
Publication Date
October 1, 1973
Publication Information
Publication: Solid-State Electronics
Volume: 16
Subject Category
Electronic Equipment
Accession Number
73A41559
Distribution Limits
Public
Copyright
Other

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