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Separation of surface and bulk minority-carrier lifetimes in siliconA photoexcitation technique is suggested which is direct and convenient, requiring little special equipment. No change in the dimensions of the crystal sample is necessary. Although related to the technique of interposing a filter between the light source and the sample, it differs in that the filter is part of the crystal itself. Basically, one of the electrodes is split into two electrodes, one collecting charge from carriers excited in the bulk. This phenomenon in which the carriers follow very closely the electric field lines has been used in position-sensitive semiconductor radiation detectors (Norbeck and Carlson, 1963) but has not been applied to lifetime measurements. In a sense, the split electrode creates a sample without a surface.
Document ID
19740046519
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Carroll, K. A.
Casper, K. J.
(Cleveland State University Cleveland, Ohio, United States)
Date Acquired
August 7, 2013
Publication Date
April 1, 1974
Publication Information
Publication: Review of Scientific Instruments
Volume: 45
Subject Category
Physics, Solid-State
Accession Number
74A29269
Distribution Limits
Public
Copyright
Other

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