Ion and electron temperatures in the SUMMA mirror device by emission spectroscopyIon temperatures were obtained in the SUMMA mirror device by observing the Doppler-broadened charge-exchange component of the 667.8and 587.6-nm He lines in He plasma and the H alpha and H beta lines in H2 plasma. The second moment of the line profiles was used as the parameter to determine ion temperature. Corrections for magnetic splitting, fine structure, monochromator slit function, and variation in charge-exchange cross section with energy are derived and included. Even for constant cross section, no magnetic splitting or fine structure, and infinitely narrow slit function, the line profile is not Gaussian, because the excitation results from a change-exchange process. Comparison is made with temperatures from a neutral particle analyzer.-
Document ID
19750036036
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Patch, R. W.
Voss, D. E.
Reinmann, J. J.
Snyder, A. (NASA Lewis Research Center Cleveland, Ohio, United States)
Date Acquired
August 8, 2013
Publication Date
October 1, 1974
Subject Category
Plasma Physics
Meeting Information
Meeting: American Physical Society, Annual Meeting