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Microcircuit failure analysis using the SEMThe scanning electron microscope adds a new dimension to the knowledge that can be obtained from a failed microcircuit. When used with conventional techniques, SEM assists and clarifies the analysis, but it does not replace light microscopy. The most advantageous features for microcircuit analysis are long working distances and great depth of field. Manufacturer related failure modes of microcircuits are metallization defects, poor bonding, surface and particle contamination, and design and fabrication faults. User related failure modes are caused by abuse, such as overstress. The Physics of Failure Procedure followed by the Astrionics Laboratory in failure analysis is described, which is designed to obtain maximum information available from each step.
Document ID
19750050817
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Nicolas, D. P.
(NASA Marshall Space Flight Center Astrionics Laboratory, Huntsville, Ala., United States)
Date Acquired
August 8, 2013
Publication Date
January 1, 1974
Subject Category
Electronics And Electrical Engineering
Accession Number
75A34889
Distribution Limits
Public
Copyright
Other

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