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Total reduction of distorted echelle spectrograms - An automatic procedureA total reduction procedure, notable for its use of a computer-controlled microdensitometer for semi-automatically tracing curved spectra, is applied to distorted high-dispersion echelle spectra recorded by an image tube. Microdensitometer specifications are presented and the FORTRAN, TRACEN and SPOTS programs are outlined. The intensity spectrum of the photographic or electrographic plate is plotted on a graphic display. The time requirements are discussed in detail.
Document ID
19750062894
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Peterson, R. C.
Title, A. M.
(Lockheed Solar Observatory Palo Alto, Calif., United States)
Date Acquired
August 8, 2013
Publication Date
October 1, 1975
Publication Information
Publication: Applied Optics
Volume: 14
Subject Category
Instrumentation And Photography
Accession Number
75A46966
Funding Number(s)
CONTRACT_GRANT: NAS8-28018
Distribution Limits
Public
Copyright
Other

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