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Optical measurements on contaminated surfacesA bidirectional reflectometer system was developed for in situ measurements of the changes in spectral reflectance of surfaces contaminated with films of organic materials. The system permits experiments with films of controlled thickness in an environment that simulates the thermal, radiation, and vacuum conditions of space. The mechanical and optical construction of the reflectometer are discussed in detail, and actual data curves are used to illustrate its operation and performance.
Document ID
19760004075
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Bonham, T. E.
(McDonnell-Douglas Corp. Saint Louis, MO, United States)
Schmitt, R. J.
(McDonnell-Douglas Corp. Saint Louis, MO, United States)
Linford, R. M. F.
(McDonnell-Douglas Corp. Saint Louis, MO, United States)
Date Acquired
August 8, 2013
Publication Date
January 1, 1975
Publication Information
Publication: NASA. Goddard Space Flight Center 8th Conf. on Space Simulation
Subject Category
Research And Support Facilities (Air)
Report/Patent Number
PAPER-51
Accession Number
76N11163
Funding Number(s)
CONTRACT_GRANT: F33615-73-C-0591
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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