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Successful large-scale use of CMOS devices on spacecraft traveling through intense radiation beltsThis paper describes the environmental models of the radiation belts and computational techniques which have been developed for predicting the radiation hazards for spacecraft. These data and techniques are then applied to the Atmosphere Explorer 51 spacecraft to explain its successful survival for more than 18 months in a severe environment. In particular, the results of the analysis are used to explain the performance of some 2400 CMOS devices, and consequently, they demonstrate the reliability of this device technology in spacecraft systems.
Document ID
19760037812
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Brucker, G. J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ohanian, R. S.
(RCA, Astro-Electronics Div., Princeton N.J., United States)
Stassinopoulos, E. G.
(NASA Goddard Space Flight Center Greenbelt, Md., United States)
Date Acquired
August 8, 2013
Publication Date
January 1, 1976
Publication Information
Publication: IEEE Transactions on Aerospace and Electronic Systems
Volume: AES-12
Subject Category
Spacecraft Design, Testing And Performance
Accession Number
76A20778
Funding Number(s)
CONTRACT_GRANT: NAS5-23003
Distribution Limits
Public
Copyright
Other

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