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Formation, structure, and orientation of gold silicide on gold surfacesThe formation of gold silicide on Au films evaporated onto Si(111) surfaces is studied by Auger electron spectroscopy (AES) and low-energy electron diffraction (LEED). Surface condition, film thickness, deposition temperature, annealing temperature, and heating rate during annealing are varied. Several oriented crystalline silicide layers are observed.
Document ID
19760044565
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
doi:10.1063/1.322827
Authors
Green, A. K. (U.S. Naval Weapons Center Michelson Laboratories, China Lake, Calif., United States)
Bauer, E. (U.S. Naval Weapons Center Michelson Laboratories, China Lake, Calif.; Clausthal, Technische Universitaet, Clausthal-Zellerfeld, Germany)
Date Acquired
August 8, 2013
Publication Date
April 1, 1976
Publication Information
Publication: Journal of Applied Physics
Volume: 47
Subject Category
Solid-State Physics
Accession Number
76A27531
Funding Number(s)
CONTRACT_GRANT: NASA ORDER R-05-030-001
Distribution Limits
Public
Copyright
Other

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