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Optical properties of ion beam textured metalsCopper, silicon, aluminum, titanium and 316 stainless steel were textured by 1000 eV xenon ions from an 8 cm diameter electron bombardment ion source. Simultaneously sputter-deposited tantalum was used to facilitate the development of the surface microstructure. Scanning electron microscopy of the ion textured surfaces revealed two types of microstructure. Copper, silicon, and aluminum developed a cone structure with an average peak-to-peak distance ranging from 1 micron for silicon to 6 microns for aluminum. Titanium and 316 stainless steel developed a serpentine ridge structure. The average peak-to-peak distance for both of these materials was 0.5 micron. Spectral reflectance was measured using an integrating sphere and a holraum reflectometer. Total reflectance for air mass 0 and 2, solar absorptance and total emittance normalized for a 425 K black body were calculated from the reflectance measurements.
Document ID
19770011307
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Hudson, W. R.
(NASA Lewis Research Center Cleveland, OH, United States)
Weigand, A. J.
(NASA Lewis Research Center Cleveland, OH, United States)
Mirtich, M. J.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 3, 2013
Publication Date
January 1, 1977
Subject Category
Metallic Materials
Report/Patent Number
NASA-TM-X-73598
E-9073
Meeting Information
Meeting: Annual Symp. on Applied Vacuum Science and Technology
Location: Tampa, FL
Country: United States
Start Date: February 14, 1977
End Date: February 16, 1977
Sponsors: Am. Vacuum Soc.
Accession Number
77N18251
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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