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Development of a microbalance suitable for space applicationThe tapered element oscillating microbalance (TEOM), an ultrasensitive mass measurement device which is suitable for both particulate and vapor deposition measurements is described. The device can be used in contamination measurements, surface reaction studies, particulate monitoring systems or any microweighing activity where either laboratory or field monitoring capability is desired. The active element of the TEOM consists of a tube or reed constructed of a material with high mechanical quality factor and having a special taper. The element is firmly mounted at the wide end while the other end supports a substrate surface which can be composed of virtually any material. The tapered element with the substrate at the free (narrow) end is set into oscillation in a clamped free mode. A feedback system maintains the oscillation whose natural frequency will change in relation to the mass deposited on the substrate.
Document ID
19770020232
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Patashnick, H.
(Dudley Observatory Latham, NY, United States)
Rupprecht, G.
(Dudley Observatory Latham, NY, United States)
Date Acquired
September 3, 2013
Publication Date
June 24, 1977
Subject Category
Spacecraft Instrumentation
Report/Patent Number
NASA-CR-150334
Accession Number
77N27176
Funding Number(s)
CONTRACT_GRANT: NAS8-31359
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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