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Record Details

Record 11 of 22584
On the determination of series resistance and diode quality factor of solar cells
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Author and Affiliation:
Anderson, R. L.(Syracuse Univ., NY, United States)
Abstract: The series resistance and diode quality factor are used for evaluation of solar cell performance. These parameters are normally deduced from the terminal I-V characteristics under forward bias. The method produces a smaller series resistance and a larger value for diode quality factor than appropriate for the device when operating as a solar cell. It is suggested that the diode quality factor be determined from measured saturated photocurrent, open circuit voltage characteristics and the series resistance be measured with an r-f bridge or calculated from a measurement of the surface sheet resistance.
Publication Date: Jan 01, 1976
Document ID:
19770023597
(Acquired Nov 18, 1995)
Accession Number: 77N30541
Subject Category: ENERGY PRODUCTION AND CONVERSION
Document Type: Conference Paper
Publication Information: NASA. Lewis Res. Center Terrest. Photovoltaic Meas., 2; p 347-354
Publisher Information: United States
Financial Sponsor: NASA; United States
Organization Source: Syracuse Univ.; Physical Electronics Lab.; NY, United States
Description: 7p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: No Copyright
NASA Terms: SCHOTTKY DIODES; SERIES (MATHEMATICS); SOLAR CELLS; ELECTRIC POTENTIAL; ELECTRODES; SEMICONDUCTOR JUNCTIONS; SILICON TRANSISTORS
Imprint And Other Notes: In NASA. Lewis Res. Center Terrest. Photovoltaic Meas., 2 p 347-354 (SEE N77-30521 21-42)
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