NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Migratory gold resistive shorts - Chemical aspects of a failure mechanismIntegrated-circuit devices using the Ti/W/Au metal system are subject to failure mechanisms based on electrolytic corrosion. The migratory gold resistive short (MGRS) failure mode is one example of this mechanism and results in the formation of filamentary or dendritic deposits of gold between adjacent stripes on the IC chip. This reaction requires the presence of a sufficient amount of water, a bias voltage between adjacent stripes, and the activation of the cathodic (-) stripe. Gold ions are transported from anode to cathode through a film of moisture adsorbed on the surface of the chip; halide ions are probably involved in the transfer. Their presence is verified experimentally by X-ray photoelectron spectroscopy. Some of the chemical and electrostatic factors involved in the MGRS mechanism are discussed in this paper, including the questions of a threshold level of moisture and contamination.
Document ID
19770036911
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Grunthaner, F. J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Griswold, T. W.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Clendening, P. J.
(California Institute of Technology, Jet Propulsion Laboratory, Pasadena Calif., United States)
Date Acquired
August 9, 2013
Publication Date
January 1, 1975
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Annual Symposium on Reliability physics 1975
Location: Las Vegas, NV
Start Date: April 1, 1975
End Date: April 3, 1975
Accession Number
77A19763
Funding Number(s)
CONTRACT_GRANT: NAS7-100
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available