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Ion beam texturingA microscopic surface texture was created by sputter-etching a surface while simultaneously sputter-depositing a lower sputter yield material onto the surface. A xenon ion-beam source was used to perform the texturing process on samples as large as 3-cm diameter. Textured surfaces have been characterized with SEM photomicrographs for a large number of materials including Cu, Al, Si, Ti, Ni, Fe, stainless steel, Au, and Ag. A number of texturing parameters are studied including the variation of texture with ion-beam powder, surface temperature, and the rate of texture growth with sputter etching time.
Document ID
19770040131
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Hudson, W. R.
(NASA Lewis Research Center Cleveland, Ohio, United States)
Date Acquired
August 8, 2013
Publication Date
February 1, 1977
Subject Category
Mechanical Engineering
Accession Number
77A22983
Distribution Limits
Public
Copyright
Other

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