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Electronic imaging and scanning systemFrequency-variable illumination has been used previously to provide high resolution imaging in one dimension. The paper extends the results on this imaging by frequency scanning to derive the expression for a two-dimensional image. This is the Fourier transformation, with respect to the angle and frequency of illumination, of the electric field detected in the far-field region of the object. The case is considered of a rough object and it is shown that for roughness finer than the resolution of the imaging system, the image has a granular appearance corresponding to the classical speckle effect. Large scale phase perturbations lead to the elevation displacement effect.
Document ID
19770042377
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Jain, A.
(California Institute of Technology, Jet Propulsion Laboratory, Pasadena Calif., United States)
Date Acquired
August 8, 2013
Publication Date
March 1, 1977
Publication Information
Publication: Applied Optics
Volume: 16
Subject Category
Optics
Accession Number
77A25229
Distribution Limits
Public
Copyright
Other

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