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Factors affecting laser-trim stability of thick film resistorsVarious factors affecting precision of trim and resistor stability were considered. The influence of machine operating parameters on resistor performance was examined and quantified through statistically designed experiments for a Q switched YAG laser system. Laser kerf quality was studied by scanning electron microscopy and related to kerf isolation resistance measurements. A relatively simple production oriented, quality control test is proposed for rapid determination of kerf electrical stability. In addition, the effect of cut design and extent of trim on precision and stability were discussed.
Document ID
19780008335
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Cote, R. E.
(Du Pont de Nemours (E. I.) and Co. Niagara Falls, NY, United States)
Headley, R. C.
(Du Pont de Nemours (E. I.) and Co. Niagara Falls, NY, United States)
Date Acquired
August 9, 2013
Publication Date
November 1, 1977
Publication Information
Publication: NASA. Marshall Space Flight Center Proc. of the 1977 NASA(ISHM Microelectronics Conf.
Subject Category
Electronics And Electrical Engineering
Accession Number
78N16278
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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