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Reevaluation of the Apollo orbital X-ray fluorescence dataA combination of Al/Mg ratios and Al/Si ratios has provided high-quality geochemical and geological information from the Apollo orbital X-ray fluorescence data. The high sensitivity of the characteristic Si X-rays to alterations in the energy spectra of the solar X-ray flux limits the analytical usefulness of the ratios involving Si. A photometric study indicates that the Si concentration in lunar materials varies by less than about + or - 15% of the Si present. In addition, particle size and surface roughness are shown to have small effects on the characteristic fluorescent X-ray radiation of Si.
Document ID
19780057702
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Hubbard, N. J.
(NASA Lyndon B. Johnson Space Center Houston, TX, United States)
Keith, J. E.
(NASA Johnson Space Center Houston, Tex., United States)
Date Acquired
August 9, 2013
Publication Date
January 1, 1977
Subject Category
Lunar And Planetary Exploration
Meeting Information
Meeting: Lunar Science Conference
Location: Houston, TX
Start Date: March 14, 1977
End Date: March 18, 1977
Accession Number
78A41611
Distribution Limits
Public
Copyright
Other

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