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Laser excited fluorescence in the cesium-xenon excimer and the cesium dimerArgon ion laser lines are used to excite fluorescence in a mixture of cesium and xenon. Excimer band fluorescence is observed at higher pressures (about 1 atm) while at lower pressures (several torr) a diffuse fluorescence due to the cesium dimer is observed whose character changes with exciting wavelength. The excimer fluorescence is shown to be directly related to the location of the exciting wavelength within previously measured Cs/Xe line shapes. This fact suggests that the excimer systems may be efficiently pumped through these line shapes. Qualitative energy-level schemes are proposed to explain the observations in both the excimer and dimer systems.
Document ID
19780068470
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Exton, R. J.
(NASA Langley Research Center Hampton, VA, United States)
Snow, W. L.
(NASA Langley Research Center Hampton, VA, United States)
Hillard, M. E.
(NASA Langley Research Center Instrument Research Div., Hampton, Va., United States)
Date Acquired
August 9, 2013
Publication Date
September 1, 1978
Publication Information
Publication: Journal of Quantitative Spectroscopy and Radiative Transfer
Volume: 20
Subject Category
Lasers And Masers
Accession Number
78A52379
Distribution Limits
Public
Copyright
Other

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