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Solar-cell defect analyzerLaser-Scanning System pinpoints imperfections in solar cells. Entire solar panels containing large numbers of cells can be scanned. Although technique is similar to use of scanning electron microscope (SEM) to locate microscopic imperfections, it differs in that large areas may be examined, including entire solar panels, and it is not necessary to remove cover glass or encapsulants.
Document ID
19790000379
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Gauthier, M. K.
(Caltech)
Miller, E. L.
(Caltech)
Shumka, A.
(Caltech)
Date Acquired
August 10, 2013
Publication Date
April 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 4
Issue: 3
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
NPO-14476
Accession Number
79B10379
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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