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Semiconductor step-stress testingReport documents behavior of discrete diodes and transistors in extensive power and temperature overstress tests. Thirty nine devices were tested in groups designated: (1) power overstress, and (2) and (3) temperature overstress. Results are of interest to users of tested components and engineers in conduction of similar tests.
Document ID
19790000455
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Meeks, H. B.
Villella, F.
Date Acquired
August 10, 2013
Publication Date
June 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 4
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25329
Accession Number
79B10455
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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