Ray-tracing the convex curved crystal X-ray spectrograph

The convex curved crystal X-ray spectrograph has recently seen increasing use for the spectral analysis of transient plasmas. The present paper describes the calculation of ray paths through the spectrograph for both localized and extended sources. The method traces a ray from any given source point to its point of diffraction by the curved crystal and then to the imaging circle, where the image point is obtained. Application of the ray tracing method is made to some actual experimental configurations to obtain resolution values and source sizes. Wavelength calibrations are obtainable with the ray tracing method in advance of instrument construction.