NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Characterization of defect growth structures in ion plated films by scanning electron microscopyGold and copper films (0.2-2 micron thick) are ion plated on very smooth stainless steel 304 and mica surfaces. The deposited films are examined by SEM to identify the morphological growth of defects. Three types of coating defects are distinguished: nodular growth, abnormal or runaway growth, and spits. The potential nucleation sites for defect growth are analyzed to determine the cause of defect formation. It is found that nuclear growth is due to inherent surface microdefects, abnormal or runaway growth is due to external surface inclusions, and spits are due to nonuniform evaporation and ejection of droplets. All these defects have adverse effects on the coatings.
Document ID
19790050979
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Spalvins, T.
(NASA Lewis Research Center Cleveland, Ohio, United States)
Date Acquired
August 9, 2013
Publication Date
April 1, 1979
Subject Category
Metallic Materials
Meeting Information
Meeting: American Vacuum Society and American Society for Metals, International Conference on Metallurgical Coatings
Location: San Diego, CA
Start Date: April 23, 1979
End Date: April 27, 1979
Accession Number
79A34992
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available