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Record Details

Record 60 of 1823
Thin silicon solar cell performance characteristics
Author and Affiliation:
Gay, C. F.(Spectrolab, Inc., Sylmar, Calif., United States)
Abstract: Refined techniques for surface texturizing, back surface field and back surface reflector formation were evaluated for use with shallow junction, single-crystal silicon solar cells. Each process was characterized individually and collectively as a function of device thickness and bulk resistivity. Among the variables measured and reported are open circuit voltage, short circuit current and spectral response. Substantial improvements were obtained by the utilization of a low cost aluminum paste process to simultaneously remove the unwanted n(+) diffused region, form the back surface field and produce an ohmic contact metallization. The highly effective BSF which results from applying this process has allowed fabrication of cells 0.05 mm thick with initial outputs as high as 79.5 mW/4 sq cm (28 C, AM0) and superior electron radiation tolerance. Cells of 0.02 mm to 0.04 mm thickness have been fabricated with power to mass ratios well in excess of 2 watts per gram.
Publication Date: Jan 01, 1978
Document ID:
19790056940
(Acquired Dec 01, 1995)
Accession Number: 79A40953
Subject Category: ENERGY PRODUCTION AND CONVERSION
Document Type: Conference Proceedings
Publication Information: (SEE A79-40881 17-44)
Publisher Information: United States
Meeting Information: Photovoltaic Specialists Conference; 13th; June 5-8, 1978; Washington, DC
Meeting Sponsor: U. S. Departement of Energy
Financial Sponsor: NASA; United States
Organization Source: Spectrolab, Inc.; Sylmar, CA, United States
Description: 6p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright
NASA Terms: SOLAR CELLS; SPACECRAFT POWER SUPPLIES; ENERGY CONVERSION EFFICIENCY; ENERGY TECHNOLOGY; FABRICATION; PERFORMANCE; SPECTRAL SENSITIVITY; SURFACE PROPERTIES
Imprint And Other Notes: In: Photovoltaic Specialists Conference, 13th, Washington, D.C., June 5-8, 1978, Conference Record. (A79-40881 17-44) New York, Institute of Electrical and Electronics Engineers, Inc., 1978, p. 444-449. NASA-sponsored research.
Availability Source: Other Sources
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