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The law of the minimum and an application to wheat yield estimationThe adaptation of the law of the minimum (LOM) to wheat yield estimation is discussed. It is demonstrated through a trial application that the LOM concept is a valuable tool for model building when regression tools are inadequate.
Document ID
19800007252
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Cate, R. B. (Lockheed Electronics Co. Houston, TX, United States)
Phinney, D. E. (Lockheed Electronics Co. Houston, TX, United States)
Trenchard, M. H. (Lockheed Electronics Co. Houston, TX, United States)
Date Acquired
August 10, 2013
Publication Date
July 1, 1979
Publication Information
Publication: NASA. Johnson Space Center Proc. of Tech. Sessions, Vol. 1 and 2
Subject Category
Earth Resources And Remote Sensing
Accession Number
80N15512
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19800007188Collected WorksProceedings of Technical Sessions, Volumes 1 and 2: the LACIE Symposium
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