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An investigation of thermal resistance in single- and multiple-cell GaAs MESFETsThermal resistances among FETs of a variable number of gates in parallel are compared. Although the thermal resistance per cell for multiple cells is higher, the total thermal resistance is still low because all the cells are parallel to one another. This implies that the multiple-cell structure is capable of dissipating more power than the single-cell structure and therefore of being used as a power FET.
Document ID
19800027954
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Wang, Y.-C.
(Howard Univ. Washington, DC, United States)
Bahrami, M.
(Maward University Washington, D.C., United States)
Date Acquired
August 10, 2013
Publication Date
August 1, 1979
Publication Information
Publication: International Journal of Electronics
Volume: 47
Subject Category
Electronics And Electrical Engineering
Accession Number
80A12124
Funding Number(s)
CONTRACT_GRANT: NSG-5158
Distribution Limits
Public
Copyright
Other

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