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Layered synthetic microstructures - Properties and applications in X-ray astronomyRefinements in vacuum deposition technology have made it possible to produce structures in which two materials are arranged in alternating layers of uniform thickness and as thin as 5 A. Such structures act as Bragg diffractors or 'artificial crystals' for X-rays, as well as they may be regarded as multilayer interference coatings. A dynamical theory is used to show how the properties of layered synthetic microstructures are dependent on the layer materials and thicknesses and how these properties can be tailored to specific applications. Laboratory results at various X-ray wavelengths are presented. In particular, specific X-ray astronomy applications in spectroscopy, imaging, polarimetry and laboratory calibration are discussed.
Document ID
19800033312
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Underwood, J. H.
(Stanford Univ. CA, United States)
Barbee, T. W., Jr.
(Stanford Univ. CA, United States)
Keith, D. C.
(Stanford University Stanford, Calif., United States)
Date Acquired
August 10, 2013
Publication Date
January 1, 1979
Subject Category
Astronomy
Meeting Information
Meeting: Space optics: Imaging X-ray optics workshop
Location: Huntsville, AL
Start Date: May 22, 1979
End Date: May 24, 1979
Accession Number
80A17482
Funding Number(s)
CONTRACT_GRANT: NAS8-32263
Distribution Limits
Public
Copyright
Other

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