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The soft X-ray polychromator for the Solar Maximum MissionThe paper considers the soft X-ray polychromator (XRP) operating in the 1.4-22.4 A range of the soft X-ray spectrum which includes many emission lines important for the diagnosis of plasmas in the 1.5-50 million deg temperature range. The flat crystal scanning spectrometer provides for a channel polychromatic mapping of flares and active regions in the resonance lines of O VIII, Ne IX, and Mg XI; in its spectral scanning mode it covers essentially the entire 1.4-22.5 A region.
Document ID
19800041021
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Acton, L. W.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Finch, M. L.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Gilbreth, C. W.
(Lockheed Research Laboratories Palo Alto, Calif., United States)
Culhane, J. L.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Bentley, R. D.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Bowles, J. A.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Guttridge, P.
(London, University College, Mullard Space Science Laboratory, Dorking, Surrey, United Kingdom)
Gabriel, A. H.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Firth, J. G.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Hayes, R. W.
(Science Research Council, Appleton Laboratory, Abingdon Oxon, United Kingdom)
Date Acquired
August 10, 2013
Publication Date
February 1, 1980
Publication Information
Publication: Solar Physics
Volume: 65
Subject Category
Spacecraft Instrumentation
Accession Number
80A25191
Funding Number(s)
CONTRACT_GRANT: NAS5-23758
Distribution Limits
Public
Copyright
Other

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