Some characteristics of low-cost silicon sheetThe paper discusses structural defects in low-cost silicon sheets and their effect on the electronic properties related to solar cell performance. Experimental data are presented on the influence of grain boundaries on minority carrier diffusion length, impurity defect interaction, and variable surface recombination velocity. An analytical model of the effect of grain boundaries on solar cell performance is constructed based on these results.
Document ID
19800062586
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Koliwad, K. M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Daud, T. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Liu, J. K. (California Institute of Technology, Jet Propulsion Laboratory, Pasadena Calif., United States)