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Super miniaturization of film capacitor dielectricsThe alignment of the stable electrical characteristics of film capacitors in the physical dimensions of ceramic and tantalum capacitors are discussed. The reliability of polycarbonate and mylar capacitors are described with respect to their compatibility with military specifications. Graphic illustrations are presented which show electrical and physical comparisons of film, ceramic, and tantalum capacitors. The major focus is on volumetric efficiency, weight reduction, and electrical stability.
Document ID
19810017842
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Lavene, B. (Electronic Concepts Eatontown, NJ, United States)
Date Acquired
August 11, 2013
Publication Date
June 1, 1981
Publication Information
Publication: NASA. Marshall Space Flight Center Capacitor Technol., Appl. and Reliability
Subject Category
Electronics And Electrical Engineering
Accession Number
81N26379
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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